Go to main content

Absolute thickness imaging of PMMA layer on corrugated transparent substrate by scanning white light interference microscope

Jobin, Marc; Foschia, Raphael
2006
Download
Formats
Format
BibTeX
MARCXML
TextMARC
MARC
DublinCore
EndNote
NLM
RefWorks
RIS
Cite
Citation

Files

Details

Title
Absolute thickness imaging of PMMA layer on corrugated transparent substrate by scanning white light interference microscope
Author(s)
Jobin, Marc (School of Engineering, Architecture and Landscape (hepia), HES-SO University of Applied Sciences Western Switzerland)
Foschia, Raphael (School of Engineering, Architecture and Landscape (hepia), HES-SO University of Applied Sciences Western Switzerland)
Date
2006-07
Published in
Microscopy and Microanalysis
Volume
2006, no.12, supp. no. 2, pp. 1774-1775
Pagination & equivalents
2 p.
DOI
https://doi.org/10.1017/S1431927606063379
ISSN
1431-9276
Article Type
scientifique
Faculty
Ingénierie et Architecture
School
HEPIA - Genève
Institute
inSTI - Institut des Sciences et Technologies industrielles
Note
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006
Record Appears in
Scientific Articles
Global

Actions

PDF