A simple model is proposed to account for the loss of collected X-ray signal by the shadowing of X-ray detectors in the scanning transmission electron microscope. The model is intended to aid the analysis of three-dimensional elemental data sets acquired using energy-dispersive X-ray tomography methods where shadow-free specimen holders are unsuitable or unavailable. The model also provides a useful measure of the detection system geometry.
Details
Title
The dark side of EDX tomography : modeling detector shadowing to aid 3D elemental signal analysis
Institute
COMATEC – Institut Conception mécanique et technologies des matériaux
Note
BURDET, Pierre est chercheur à la HES-SO, HEIG-VD, depuis 2018. Cette publication a été rédigée par un membre de l’institut COMATEC - Institut de Conception, Matériaux, Emballage & Conditionnement.